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Thin Film Analyzers & Controllers
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Thin Film Deposition Controllers/QCM INFICON market-leading thin film deposition controllers, monitors and QCM measurement instruments control deposition rate and thickness of the most complex processes with unsurpassed measurement speed and precision. |
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Electron Beam Gun Crucible Indexer, CI-100 Used to rotate multi-pocket electron beam gun sources through a rotary vacuum feedthrough. |
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Fully Automatic Ultra Thin Film Analyzer , UT-300 Spectroscopic Thin Film Analyzer For fully-automated measurement of a broad range of films, from 1 nm ultra-thin film to complex multilayer structures |
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Auto SE, Simple Thin Film measurement tool Visualize your sample and measure thin film thickness and optical constants in seconds. |
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MM-16 - Spectroscopic Ellipsometer Easy-to-use, rapid and versatile spectroscopic ellipsometer. |
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UVISEL, Spectroscopic Ellipsometer Measure thin film thickness and optical constants. For research and process development. |
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Full Automatic Film Analyzer, FF-1000 For the evaluation and analysis of various thin films in constantly evolving Flat Panel Display (FPD) production processes. |